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PPN004672119 |
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20180703153100.0 |
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|a 072504773
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|a sib0007100
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|a DYNIX_BUNAN_198328
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| 100 |
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|a 19990302d1965 ||||0frey0103 ba
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| 101 |
0 |
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|a eng
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| 102 |
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|a NL
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| 105 |
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|a y |||||||||
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| 200 |
1 |
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|a X-ray analysis papers
|e a volume of twenty-four selected reprints from Philips laboratories Briarcliff manor, New York, U.S.A
|f ed. by William Parrish
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| 205 |
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|a 2nd ed
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| 210 |
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|a Eindhoven
|c Centrex publ
|d 1965
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| 215 |
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|a XII-310 p
|c ill., graph., tabl
|d 28 cm
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| 300 |
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|a La 1e éd. de 1962 porte le titre : Advances in X-ray diffractometry and X-ray spectrography
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| 320 |
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|a Bibliogr. : en fin de chapitre
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| 606 |
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|a RAYON X
|x INSTRUMENTS/CRISTALLOGRAPHIE
|2 rameau
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| 606 |
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|3 PPN027480097
|a Rayons X
|2 rameau
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| 702 |
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1 |
|a Parrish
|b William
|4 340
|
| 801 |
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3 |
|a FR
|b Abes
|c 20050325
|g AFNOR
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| 801 |
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3 |
|a FR
|b SF
|g AFNOR
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| 915 |
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|5 441092104:179745085
|a 1161188547
|b 1161188547
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| 919 |
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|5 441092104:179745085
|a 1161188547
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| 930 |
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|5 441092104:179745085
|b 441092104
|a 620.179 XRA
|j u
|
| 979 |
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|a SCI
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| 998 |
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|a 220875
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