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01402cam a2200421 4500 |
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PPN007900597 |
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20220706055400.0 |
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|a US
|b 6310079 //r84
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020 |
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|a GB
|b 64-18350
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|a sib0954525
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|a ocm10431633
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|z ocm545151
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|a urouen157719
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|a PRITEC.POITIER3.030580337001
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100 |
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|a 19971105d1964 ||||0frey0103 ba
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101 |
1 |
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|a eng
|c rus
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102 |
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|a GB
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|a y |||||||||
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200 |
1 |
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|a Structure analysis by electron diffraction
|b Texte imprimé
|f by B.K. Vainshtein
|g translated and edited by E. Feigl and J.A. Spink
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210 |
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|a Oxford
|a London [etc.]
|c Pergamon Press
|d 1964
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215 |
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|a 1 vol. (ix-420 p.)
|c ill.
|d 24 cm
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300 |
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|a Translation of [Strukturnai︡a︠ ėlektronografii︡a︠]
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304 |
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|a Strukturnaja Êelektronografija
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454 |
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| |
|t Strukturnaja élektronografija
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606 |
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|3 PPN027576809
|a Cristallographie
|2 rameau
|
606 |
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|a Electron
|x diffraction
|2 rameau
|
676 |
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|a 548.8
|
680 |
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|a QD921
|b .V313 1964
|
700 |
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1 |
|3 PPN03422047X
|a Vainshtein
|b Boris Konstantinovitch
|f 1921-....
|4 070
|
702 |
|
1 |
|a Feigl
|b E
|4 730
|4 340
|
702 |
|
1 |
|a Spink
|b J.A.
|4 730
|4 340
|
801 |
|
3 |
|a FR
|b Abes
|c 20080321
|g AFNOR
|
801 |
|
3 |
|a FR
|b SF
|g AFNOR
|
801 |
|
1 |
|a US
|b OCLC
|g AACR2
|
801 |
|
2 |
|a FR
|b AUROC
|g AFNOR
|
930 |
|
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|5 441092306:333271661
|b 441092306
|a 530.14 VAI
|j U
|
979 |
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|a ECN
|
998 |
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|a 527048
|