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LEADER |
00985cam a2200313 4500 |
001 |
PPN021296545 |
005 |
20150116014200.0 |
010 |
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|a 0-471-51104-8
|
020 |
|
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|a US
|b 8924881
|
020 |
|
|
|a GB
|b 91-14057
|
035 |
|
|
|a ocm20492380
|
100 |
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|a 19890922d1990 u b0engy0103 ba
|
101 |
0 |
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|a eng
|
102 |
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|a US
|b ny
|
105 |
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|a a a 001|y
|
200 |
1 |
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|a Semiconductor material and device characterization
|f Dieter K. Schroder
|
210 |
|
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|a New York
|c Wiley
|d c1990
|
215 |
|
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|a xv, 599 p.
|c ill.
|d 25 cm
|
300 |
|
|
|a "A Wiley-Interscience publication."
|
320 |
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|a Includes bibliographical references and index.
|
606 |
|
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|3 PPN027282570
|a Semiconducteurs
|2 rameau
|
676 |
|
|
|a 621.381/52
|v 20
|
680 |
|
|
|a QC611
|b .S335 1990
|
700 |
|
1 |
|3 PPN085951781
|a Schroder
|b Dieter K
|
801 |
|
3 |
|a FR
|b Abes
|c 20050420
|g AFNOR
|
801 |
|
1 |
|a US
|b OCLC
|c 20050420
|g AACR2
|
801 |
|
2 |
|a FR
|b AUROC
|c 20050420
|g AFNOR
|
930 |
|
|
|5 441092105:150418353
|b 441092105
|a 621.381 52 SCH
|j u
|
998 |
|
|
|a 60415
|