Applied scanning probe methods : V Scanning probe microscopy techniques
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I IV that a large number of technical and applicational aspect...
Enregistré dans:
Auteurs principaux : | , , |
---|---|
Format : | Livre |
Langue : | anglais |
Titre complet : | Applied scanning probe methods. V, Scanning probe microscopy techniques / edited by Bharat Bhushan, Satoshi Kawata, Harald Fuchs. |
Édition : | 1st ed. 2007. |
Publié : |
Berlin, Heidelberg :
Springer Berlin Heidelberg
, [20..] Cham : Springer Nature |
Collection : | Nanoscience and technology (Internet) |
Accès en ligne : |
Accès Nantes Université
Accès direct soit depuis les campus via le réseau ou le wifi eduroam soit à distance avec un compte @etu.univ-nantes.fr ou @univ-nantes.fr |
Note sur l'URL : | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex |
Condition d'utilisation et de reproduction : | Conditions particulières de réutilisation pour les bénéficiaires des licences nationales : https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 |
Contenu : | Integrated Cantilevers and Atomic Force Microscopes. Electrostatic Microscanner. Low-Noise Methods for Optical Measurements of Cantilever Deflections. Q-controlled Dynamic Force Microscopy in Air and Liquids. High-Frequency Dynamic Force Microscopy. Torsional Resonance Microscopy and Its Applications. Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy. Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale. New AFM Developments to Study Elasticity and Adhesion at the Nanoscale. Near-Field Raman Spectroscopy and Imaging |
Sujets : | |
Documents associés : | Scanning probe microscopy techniques:
Applied scanning probe methods Autre format: Applied Scanning Probe Methods V Autre format: Applied Scanning Probe Methods V |
LEADER | 05571clm a2200733 4500 | ||
---|---|---|---|
001 | PPN123156289 | ||
003 | http://www.sudoc.fr/123156289 | ||
005 | 20241002160200.0 | ||
010 | |a 978-3-540-37316-2 | ||
017 | 7 | 0 | |a 10.1007/978-3-540-37316-2 |2 DOI |
035 | |a (OCoLC)690293846 | ||
035 | |a Springer978-3-540-37316-2 | ||
035 | |a SPRINGER_EBOOKS_LN_PLURI_10.1007/978-3-540-37316-2 | ||
035 | |a Springer-11644-978-3-540-37316-2 | ||
100 | |a 20080410f20 u y0frey0103 ba | ||
101 | 0 | |a eng |2 639-2 | |
102 | |a DE | ||
135 | |a dr||||||||||| | ||
181 | |6 z01 |c txt |2 rdacontent | ||
181 | 1 | |6 z01 |a i# |b xxxe## | |
182 | |6 z01 |c c |2 rdamedia | ||
182 | 1 | |6 z01 |a b | |
183 | |6 z01 |a ceb |2 RDAfrCarrier | ||
200 | 1 | |a Applied scanning probe methods |h V |i Scanning probe microscopy techniques |f edited by Bharat Bhushan, Satoshi Kawata, Harald Fuchs. | |
205 | |a 1st ed. 2007. | ||
214 | 0 | |a Berlin, Heidelberg |c Springer Berlin Heidelberg | |
214 | 2 | |a Cham |c Springer Nature |d [20..] | |
225 | 0 | |a NanoScience and Technology |x 2197-7127 | |
327 | 1 | |a Integrated Cantilevers and Atomic Force Microscopes |a Electrostatic Microscanner |a Low-Noise Methods for Optical Measurements of Cantilever Deflections |a Q-controlled Dynamic Force Microscopy in Air and Liquids |a High-Frequency Dynamic Force Microscopy |a Torsional Resonance Microscopy and Its Applications |a Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy |a Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale |a New AFM Developments to Study Elasticity and Adhesion at the Nanoscale |a Near-Field Raman Spectroscopy and Imaging | |
330 | |a The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging | ||
371 | 0 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | |
371 | 0 | |a Accès soumis à abonnement pour tout autre établissement | |
371 | 1 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales |c https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | |
410 | | | |0 17428859X |t Nanoscience and technology (Internet) |x 2197-7127 | |
452 | | | |0 117763330 |t Applied scanning probe methods |h V |i Scanning probe microscopy techniques |f Bharat Bhushan, Harald Fuchs, Satoshi Kawata (eds.) |c Berlin |n Springer |d 2007 |p 1 vol. (XIV- 344 p.) |s Nanoscience and technology |y 3-540-37315-2 | |
452 | | | |t Applied Scanning Probe Methods V |b Texte imprimé |y 9783642072116 | |
452 | | | |t Applied Scanning Probe Methods V |b Texte imprimé |y 9783540827696 | |
610 | 1 | |a Chemistry | |
610 | 2 | |a Physical Chemistry | |
610 | 2 | |a Solid State Physics and Spectroscopy | |
610 | 2 | |a Nanotechnology | |
610 | 2 | |a Surfaces and Interfaces, Thin Films | |
610 | 2 | |a Polymer Sciences | |
610 | 1 | |a Nanotechnology and Microengineering | |
610 | 2 | |a Spectroscopy and Microscopy | |
610 | 2 | |a Surface and Interface Science, Thin Films | |
615 | |a @Chemistry and Materials Science |n 11644; ZDB-2-CMS |2 Springer | ||
615 | |a @Chemistry and Materials Science |n 11644 |2 Springer | ||
676 | |a 620.5 |v 23 | ||
680 | |a T174.7 | ||
700 | 1 | |a Bhushan |b Bharat |4 651 | |
701 | 1 | |a Fuchs |b Harald |4 651 | |
701 | 1 | |a Kawata |b Satoshi |4 651 | |
801 | 3 | |a FR |b Abes |c 20240911 |g AFNOR | |
801 | 1 | |a DE |b Springer |c 20220104 |g AACR2 | |
856 | 4 | |q PDF |u https://doi.org/10.1007/978-3-540-37316-2 |z Accès sur la plateforme de l'éditeur | |
856 | 4 | |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-XL10V48K-P |z Accès sur la plateforme Istex | |
856 | 4 | |5 441099901:830930620 |u https://budistant.univ-nantes.fr/login?url=https://doi.org/10.1007/978-3-540-37316-2 | |
915 | |5 441099901:830930620 |b SPRING4-00391 | ||
930 | |5 441099901:830930620 |b 441099901 |j g | ||
979 | |a NUM | ||
991 | |5 441099901:830930620 |a Exemplaire créé en masse par ITEM le 01-10-2024 15:47 | ||
997 | |a NUM |b SPRING4-00391 |d NUMpivo |e EM |s d | ||
998 | |a 980343 |